ZHU Xinghua;YANG Dingyu;SUN Hui
. 2011, 42(09): 1555-1558.
Abstract (
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Polycrystalline PbI2 thick ?lms were grown on glass substrates using close-spaced sublimation(CSS) technique, and its structural, morphological and photoluminescent(PL) properties as a function of depostion condition were investigated. It is found that the deposition rate increases rapidly with increasing sublimation source temperature and decreasing deposition pressure. The crystal structure and surface morphology of samples as function of deposition rate was characterized by X-ray diffraction (XRD) and scanning electron microscopy (SEM). The results reavealed PbI2 thick ?lms have a layered hexagonal structure, formed by the stacking of (001) plane, with a prefferred [001] orientation, and the grain size decreases with increasing deposition rate. meanwhile, the (001) diffraction peaks( ) was shifted towards large-angle as a result of decreasing lattice constant attributes to increasing films compressive stress. The SEM images of samples also show that the [001] orientation( axis) of layered grains is parallel to the substrate, and its ordering degree as well as film density reduces with the increases of deposition rate. Furthermore, high deposition rate also presents “hexagonal center” subgrain, grown perpendicularly on the layered grains, lead to a dramatically improve in surface roughness. Finally, the samples PL spectra only exhibit intrinsic luminescence, and the PL peak shifted to longer wavelengths with braoden peak width and lower intensity, owing to increasing deposition rate.