Study on Phase Transition Current Characterization dependent on Temperature and Electric Field for Antiferroelectric Thick Films On Silicon Substrates

Yu-Hua Yang;Miao-Xuan Du;Xin-Feng Guan

PDF(1722 KB)
Jorunal of Functional Materials ›› 2012, Vol. 43 ›› Issue (09) : 1212-1216.
研究与开发

Study on Phase Transition Current Characterization dependent on Temperature and Electric Field for Antiferroelectric Thick Films On Silicon Substrates

    {{javascript:window.custom_author_en_index=0;}}
  • {{article.zuoZhe_EN}}
Author information +
History +

HeighLight

{{article.keyPoints_en}}

Abstract

{{article.zhaiyao_en}}

Key words

Cite this article

EndNote

Ris (Procite)

Bibtex

Download Citations
{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2012, 43(09): 1212-1216

References

Publishing order | Descend order by publishing year | Descend order by cited within

References

{{article.reference}}

Funding

RIGHTS & PERMISSIONS

{{article.copyrightStatement_en}}
{{article.copyrightLicense_en}}
PDF(1722 KB)

Accesses

Citation

Detail
Sections
Recommended
Copyright © Jorunal of Functional Materials
Tel: 023－68264739　 　
E-mail: gnclbjb@126.com　
Total visitors:
Visitors of today:
Now online:
渝公网安备50010902000552号　渝ICP备2022001025号-1

/

〈 〉