Analysis of 9,9′-Bianthracene Thin Films Using Atomic Force Microscopy and X- ray Diffraction

Analysis of 9,9′-Bianthracene Thin Films Using Atomic Force Microscopy and X- ray Diffraction

LI Jiang feng ;;

Journal of Functional Materials ›› 2010, Vol. 41 ›› Issue (08) : 13-0.

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Analysis of 9,9′-Bianthracene Thin Films Using Atomic Force Microscopy and X- ray Diffraction

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