First-principles investigation of electronic structure differences between deep-level and shallow-level dopants in crystalline silicon

ZHANG Hongjia, CAI Hongzheng, LU Jianguang, ZHANG Chenguang, ZHANG Lifeng, LI Yaqiong

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Journal of Functional Materials ›› 2026, Vol. 57 ›› Issue (8) : 162-167. DOI: 10.3969/j.issn.1001-9731.2026.08.019
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First-principles investigation of electronic structure differences between deep-level and shallow-level dopants in crystalline silicon

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{{article.zuoZheEn_L}}. {{article.title_en}}. {{journal.qiKanMingCheng_EN}}. 2026, 57(8): 162-167 https://doi.org/10.3969/j.issn.1001-9731.2026.08.019

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