二氧化硅薄膜的微观结构与驻极体特性的相关性研究
陈钢进;郝天亮
二氧化硅薄膜的微观结构与驻极体特性的相关性研究
Study on Relations between Microstructures and Electret Properties for SiO2 film
| {{custom_ref.label}} | 
									
										 {{custom_citation.content}} 
										
										
										
										
										
											{{custom_citation.annotation}}
										 
									
									 | 
								
/
| 〈 | 
								 | 
							〉 |